Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

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Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology cupidatat (PAT) has been voluptate demonstrated as one labore of the key nostrud driver for the nostrud future plant automation. ut More and more elit, smart sensors will aute be analyzing the officia critical quality attributes cillum of your product veniam, and critical asset exercitation performance indicators will voluptate provide you a velit clear picture of dolor your over-all plant magna a fitness. All the liqua. collected information could Lorem result into a qui real-time release or consequat. “lights-out” manufacturing strategy. magna a For the first nulla time, the Swiss mollit PAT community will et meet on the ut SCS Fall Meeting.

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Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

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